VTTF Members

Currently VTTF has 42 members.

C

• » Prof. Mango Chia-Tso Chao (趙家佐)
  • SOC Testing & DFT Lab
  • Dept. Electronics Engineering, National Chiao Tung University (交通大學電子系)
  • E-mail: mango@faculty.nctu.edu.tw
  • Tel: (03)5731671
  • Test Technology Interests:
  • VLSI testing
  • Statistical timing analysis
  • Physical design automation
  • Test compression/compaction
• » Prof. Shih-Chieh Chang (張世杰)
  • VLSI/CAD SC laboratory
  • Dept. Computer Science, National Tsing Hua University (清華大學資工系)
  • E-mail: scchang@cs.nthu.edu.tw
  • Tel: (03)5715131 ext.42964
  • Test Technology Interests:
  • DFT, test synthesis, BIST
• » Prof. Soon-Jyh Chang (張順志)
  • Mixed Signal Integrated Circuit Laboratory
  • Dept. Electrical Engineering, National Cheng Kung University (成功大學電機系)
  • E-mail: soon@mail.ncku.edu.tw
  • Tel: (06)2757575 ext.62380
  • Fax: (06)2345482
  • Test Technology Interests:
  • Mixed-Signal IC Design, Mixed-Signal IC Test
• » Prof. Tsin-Yuan Chang (張慶元)
  • Lab for Reliable Computing (LaRC)
  • Dept. Electrical Engineering, National Tsing Hua University (清華大學電機系)
  • E-mail: tyc@ee.nthu.edu.tw
  • Tel: (03)5742581
  • Fax: (03)5715971
  • Test Technology Interests:
  • IDDQ Fault, BIST, VLSI Testing
• » Dr. Yeong-Jar Chang (張永嘉)
  • SoC Technology Center
  • SoC Technology Center, Industrial Technology Research Institute (工研院系統晶片技術發展中心)
  • E-mail: ot@itri.org.tw
  • Tel: (03)5913977
  • Fax: (03)5912040
  • Test Technology Interests:
  • Testing and DfT for Digital, Memory, Analog and SoC
  • Software-Based SoC Testing and Diagnosis
  • High-Speed Serial Link Testing
• » Prof. Jwu E Chen (陳竹一)
  • Dept. Electrical Engineering, Central University (中央大學電機系)
  • E-mail: jechen@chpi.edu.tw
  • Tel: (03)5374281 ext.8318, 8325
  • Fax: (03)5373771
  • Test Technology Interests:
  • Fault simulation, test pattern generation
  • mixed-signal testing
  • test error analysis
  • test management, test economics
  • delay-fault testing
• » Prof. Mely Chen (陳美麗)
  • System and IC Design Automation Lab.
  • Dept. Information & Computer Engineering, Chung Yuan Christian University (中原大學資工系)
  • E-mail: mlchen@ice.cycu.edu.tw
  • Tel: (03)6254712
  • Fax: (03)6254799
  • Test Technology Interests:
  • VLSI & Electronics System, Design Automation
• » Dr. Ji-Jan Chen (陳繼展)
  • SoC Technology Center
  • SoC Technology Center, Industrial Technology Research Institute (工研院系統晶片技術發展中心)
  • E-mail: jijanchen@itri.org.tw
  • Tel: (03)5919019
  • Fax: (03)5912040
  • Test Technology Interests:
  • Scan-based testing, low-power testing and SoC test integration
• » Prof. Ching-Hwa Cheng (鄭經華)
  • VLSI Lab.
  • Dept. Electronic Engineering, Feng Chia University (逢甲大學電子系)
  • E-mail: chengch@fcu.edu.tw
  • Tel: (04) 8511888 ext.4963
  • Test Technology Interests:
  • CAD/Testing on signalintegraity (for mixed dynamic/static circuit)
  • Medical-chip(MeMs) testing

H

• » Prof. Hao-Chiao Hong (洪浩喬)
  • Dept. Electrical and Control Engineering, National Chiao Tung University (交通大學電機系)
  • E-mail:hchong@cn.nctu.edu.tw
  • Tel: (03)5712121 ext.54375
  • Fax: (03)5775998
  • Test Technology Interests:
  • DFT and BIST of Mixed-signal Circuit
• » Prof. Jin-Hua Hong (洪進華)
  • VLSI Lab.
  • Dept. Electrical Engineering, National University of Kaohsiung (高雄大學電機系)
  • E-mail:jhhong@nuk.edu.tw
  • Tel: (07)5919438
  • Fax: (07)5919372
  • Test Technology Interests:
  • DFT, BIST,analog/mixed-signal testing
• » Prof. Chun-Lung Hsu (許鈞瓏)
  • Integrated Circuit Design & Testing Laboratory
  • Dept. Electrical Engineering, National Dong Hwa University (東華大學電機系)
  • E-mail:cch@mail.ndhu.edu.tw
  • Tel: (03)8634079
  • Fax: (03)8634060
  • Test Technology Interests:
  • Mixed-Signal Testing, DFT, BIST
• » Prof. Chih-Tsun Huang (黃稚存)
  • VLSI/CAD Lab.
  • Dept. Computer Science, National Tsing Hua University (清華大學資工系)
  • E-mail:cthuang@cs.nthu.edu.tw
  • Tel: (03)5731213
  • Fax: (03)5723694
  • Test Technology Interests:
  • Memory test, system test
• » Prof. Der-Chen Huang (黃德成)
  • System on Chip Lab
  • Dept. Computer Science, National Chung Hsing University (中興大學資科系)
  • E-mail:huangdc@cs.nchu.edu.tw
  • Tel: (04)22840497 ext. 920
  • Fax: (04)22853869
  • Test Technology Interests:
  • DFT, Memory BIST/BISR/BISD
• » Prof. Jiun-Lang Huang (黃俊郎)
  • Laboratory of Dependable Systems
  • Dept. Electrical Engineering, National Taiwan University (台灣大學電機系)
  • E-mail:jlhuang@cc.ee.ntu.edu.tw
  • Tel: (02)3366-3609
  • Fax: (02)2365-8686
  • Test Technology Interests:
  • Analog/mixed-signal testing
  • High-speed serial interface testing
  • VLSI system verification
• » Prof. Shi-Yu Huang (黃錫瑜)
  • Lab for Reliable Computing (LaRC)
  • Dept. Electrical Engineering, National Tsing Hua University (清華大學電機系)
  • E-mail:syhuang@ee.nthu.edu.tw
  • Tel: (03)5731147
  • Fax: (03)5715971
  • Test Technology Interests:
  • Fault diagnosis, power estimation, defect-based testing
• » Prof. Tsung-Chu Huang (黃宗柱)
  • VLSI Lab.
  • Dept. Electronic Engineering, National Changhua University of Education (彰化師範大學電子系)
  • E-mail:tch@cc.ncue.edu.tw
  • Tel: (04)7232105 ext. 7131
  • Fax: (04)7211079
  • Test Technology Interests:
  • Low-power test, ATPG, SOC Test

J

• » Prof. Wen-Ben Jone (鍾文邦)
  • Dept. Electrical & Computer Engineering and Computer Science, University of Cincinnati
  • E-mail:wjone@ececs.uc.edu
  • Tel: (513)5563319
  • Fax: (513)5567326
  • Test Technology Interests:
  • Memory testing, low-power design, signal integrity testing, MEMS testing, high-speed circuit testing, design for testability, built in self testing
• » Prof. Jing-Yang Jou (周景揚)
  • Electronic Design Automation Laboratory
  • Dept. Electronics Engineering, National Chiao Tung University (交通大學電子系)
  • E-mail:jyjou@bestmap.ee.nctu.edu.tw
  • Tel: (03)5731850
  • Fax: (03)5724361
  • Test Technology Interests:
  • BIST, IDDQ Testing, Boundary Scan

L

• » Prof. Chung-Len Lee (李崇仁)
  • VLSI Testing and Design for Testability Group
  • Dept. Electronic Engineering, National Chiao Tung University (交通大學電子系)
  • E-mail:cllee@cc.nctu.edu.tw
  • Tel: (03)5731853
  • Test Technology Interests:
  • Test generation, IDDQ,BIST, DFT, SOC testing, Deep-submicron testing, Analog testing
• » Prof. Kuen-Jong Lee (李昆忠)
  • VLSI Test Lab.
  • Dept. Electrical Engineering, National Cheng Kung University (成功大學電機系)
  • E-mail:kjlee@mail.ncku.edu.tw
  • Tel: (06)2757575-62371, (06)2763881
  • Fax: (06)2761749
  • Test Technology Interests:
  • SOC testing, test time/cost reduction, low-power testing, memory testing, error tolerance
• » Prof. Chien-Mo James Li (李建模)
  • Lab of Dependable Systems (LaDS)
  • Dept. Electrical Engineering, National Taiwan University (中央大學電機系)
  • E-mail:cmli@cc.ee.ntu.edu.tw
  • Tel: (02)23635251-314
  • Fax: (02)23681679
  • Test Technology Interests:
  • Fault Diagnosis, Defect Based Testing
• » Prof. Jin-Fu Li (李進福)
  • Advanced Reliable Systems Lab.
  • Dept. Electrical Engineering, National Central University (中央H大學電機系)
  • E-mail:jfli@ee.ncu.edu.tw
  • Tel: (03)4227151 ext.34464
  • Fax: (03)4255830
  • Test Technology Interests:
  • SOC test, Embedded memory test
• » Prof. Katherine Shu-Min Li (李淑敏)
  • EDA&T Lab
  • Dept. Computer Science and Engineering, National Sun Yat-Sen University (中山大學資訊工程學系)
  • E-mail: smli@cse.nsysu.edu.tw
  • Tel: (07)525 2000 ext. 4320
  • Fax: (07)5254301
  • Test Technology Interests:
  • Test Design, ATPG, BIST and DFT,Core and System Test
• » Prof. Hsing-Chung Liang (梁新聰)
  • Dept. Electronic Engineering, Chung Yuan Christian University (中原大學電子系)
  • E-mail:hcliang@cycu.edu.tw
  • Tel: (03)2654623
  • Test Technology Interests:
  • TPG, DFT, Memory Repair
• » Prof. Chun-Wei Lin (林俊偉)
  • Dept. Electronic Engineering, National Yunlin University of Science & Technology (雲林科技大學電子系)
  • E-mail: linwei@yuntech.edu.tw
  • Tel: (03)2654623
  • Tel : 05-5342601 ext. 4345
  • Fax : 05-5312063
  • Test Technology Interests:
  • BIST, Analog/Mixed-signal Testing
• » Prof. Jing-Jia Liou (劉靖家)
  • Lab for Reliable Computing (LaRC)
  • Dept. Electrical Engineering, National Tsing Hua University (清華大學電機系)
  • E-mail:jjliou@ee.nthu.edu.tw
  • Tel: (03)5715131 ext. 4142
  • Test Technology Interests:
  • Delay testing, DSM Noise/Defects Analysis, Statistical Timing Analysis
• » Prof. Chih-Wen Lu (盧志文)
  • Mixed-signal IC Design Lab.
  • Dept. Electrical Enineering, National Chi Nan University (暨南大學電機系)
  • E-mail:cwlu@ncnu.edu.tw
  • Tel: (049) 910960-4803
  • Fax: (049) 917810
  • Test Technology Interests:
  • FPGA Testing, BIST, DFT
• » Prof. Shyue-Kung Lu (呂學坤)
  • VLSI/CAD Lab.
  • Dept. Electronic Engineering, Fu Jen Catholic University (輔仁大學電子系)
  • E-mail:sklu@ee.fju.edu.tw
  • Tel: (02)29031111-3800
  • Fax: (02)29042638
  • Test Technology Interests:
  • FPGA Testing, BIST, DFT

R

• » Prof. Jiann-Chyi Rau (饒建奇)
  • VLSI Lab.
  • Dept. Electrical Engineering, Tamkang University (淡江大學電機系)
  • E-mail:jcrau@ee.tku.edu.tw
  • Tel: (02)26215656 ext. 2729
  • Fax: (02)26221565
  • Test Technology Interests:
  • DFT, test synthesis, BIST

S

• » Prof. Meng-Lieh Sheu (許孟烈)
  • Advanced System Integral Circuit Design Laboratory
  • Dept. Electrical Enineering, National Chi Nan University (暨南大學電機系)
  • E-mail:sheu@ncnu.edu.tw
  • Tel: (049)910960 ext. 4881
  • Fax: (049)917810
  • Test Technology Interests:
  • DFT, BIST, tester
• » Prof. Ming-Der Shieh (謝明得)
  • VLSI Design Lab
  • Dept. Electrical Enineering, National Cheng Kung University (成功大學電機系)
  • E-mail:shiehm@mail.ncku.edu.tw
  • Tel: (06)2757575 ext. 62324
  • Fax: (06)2345482
  • Test Technology Interests:
  • DFT, BIST and Mixed-signal testing
• » Prof. Chauchin Su (蘇朝琴)
  • MIxed-Signal Circuit Lab
  • Dept. Electrical and Control Engineering, National Chiao Tung University (交通大學電機系)
  • E-mail:ccsu@cn.nctu.edu.tw
  • Tel: (03)5131310
  • Fax: (03)5775998
  • Test Technology Interests:
  • Interconnect Testing, Analog/Digital Testing

T

• » Prof. Jing-Jou Tang (唐經洲)
  • NICE Semiconductor Circuit Center
  • Dept. Electronic Engineering, Southern Taiwan University of Technology (南台科技大學電子系)
  • E-mail:tjj@mail.stut.edu.tw
  • Tel: (06)2533131 ext. 3100 or 3101
  • Fax: (06)2426911
  • Test Technology Interests:
  • OPC (Optical Proximity Correction)LCD Test Pattern Generation, LCD Test Pattern Generation

W

• » Prof. Sying-Jyan Wang (王行健)
  • Computer Aided Design Lab
  • Dept. Computer Science, National Chung Hsing University (中興大學資科系)
  • E-mail:sjwang@cs.nchu.edu.tw
  • Tel: (04)22840497 ext. 910
  • Fax: (04)22853869
  • Test Technology Interests:
  • Interconnect testing, BIST, test compression, low-power testing
• » Prof. Wei-Lun Wang (王維倫)
  • VLSI Lab
  • Dept. Electronic Engineering, Cheng Shiu University (正修大學電子系)
  • E-mail:wlwang@csu.edu.tw
  • Tel: (07)7310606 ext. 540
  • Fax: (07)7331758
  • Test Technology Interests:
  • Memory BIST, Logic BIST
• » Prof. Hung-Pin Wen (溫宏斌)
  • Computational Intelligence on Automation Laboratory
  • Dept. Communication Engineering, National Chiao Tung University (交通大學電信系)
  • E-mail: opwen@cm.nctu.edu.tw
  • Tel: 035712121 ext 54621
  • Test Technology Interests:
  • High-Performance Microprocessor Verification and Test
• » Prof. Yun-Che Wen (溫昀哲)
  • Dept. Aeronauties and Astronauties, National Cheng Kung University (成功大學航太系)
  • E-mail:wenyc@mail.ncku.edu.tw
  • Tel: (06)2096905
  • Fax: (06)2096834
  • Test Technology Interests:
  • Analog test, BIST test
• » Prof. Chin-Long Wey (魏慶隆)
  • Dept. Electrical Engineering, Central University (中央大學電機系)
  • E-mail:clwey@ee.ncu.edu.tw
  • Tel: (03)4279094
  • Fax: (03)4273335
  • Test Technology Interests:
  • Mixed-signal VLSI Design and Test, Reliability, and Manufacturability of Mixed-Signal ICs; Fault-tolerant embedded computing systems.
• » Prof. Cheng-Wen Wu (吳誠文)
  • Lab for Reliable Computing (LaRC)
  • Dept. Electrical Engineering, National Tsing Hua University (清華大學電機系)
  • E-mail:cww@ee.nthu.edu.tw
  • Tel: (03)5731154
  • Fax: (03)5715971
  • Test Technology Interests:
  • Memory test, system test, on-line test
• » Dr. Wen-Ching Wu (吳文慶)
  • SoC Technology Center
  • SoC Technology Center, Industrial Technology Research Institute (工研院系統晶片技術發展中心)
  • E-mail:wcwu@itri.org.tw
  • Tel: (03)5913488
  • Fax: (03)5912040
  • Test Technology Interests:
  • DFT, BIST, mixed-sgnal testing

Y

• » Prof. Ching-Wei Yeh (葉經緯)
  • Dept. Electrical Engineering, National Chung Cheng University (中正大學電機系)
  • E-mail:ieecwy@ccunix.ccu.edu.tw
  • Tel: (05)2720411 ext. 6196
  • Fax: (05)2720862
  • Test Technology Interests:
  • General